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Robust inference for intermittently-monitored step-stress tests under Weibull lifetime distributions

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dc.contributor.authorBalakrishnan, Narayanaswamy
dc.contributor.authorJaenada Malagón, María
dc.contributor.authorPardo, Leandro
dc.contributor.funderMinisterio de Universidades (España)
dc.date.accessioned2025-11-06T16:00:54Z
dc.date.available2025-11-06T16:00:54Z
dc.date.issued2025-11-03
dc.descriptionThis is an Accepted Manuscript of an article published by Wiley in "Quality and Reliability Engineering International (2025)", available at: https://doi.org/10.1002/qre.70113
dc.descriptionEste es el manuscrito aceptado del artículo publicado por Wiley en "Quality and Reliability Engineering International (2025)", disponible en línea: https://doi.org/10.1002/qre.70113
dc.description.abstractMany modern products exhibit high reliability under normal operating conditions. Conducting life tests under these conditions may result in very few observed failures, insufficient for accurate inferences. Instead, accelerated life tests (ALTs) must be performed. One of the most popular ALT designs is the step-stress test, which shortens the product’s lifetime by progressively increasing the stress level at which units are subjected to at some pre-specified times. Classical estimation methods based on the maximum likelihood estimator (MLE) enjoy suitable asymptotic properties but they lack robustness. That is, data contamination can significantly impact the statistical analysis. In this paper, we develop robust inferential methods for highly reliable devices based on the density power divergence (DPD) for estimating and testing under the step-stress model with intermittent monitoring and Weibull lifetime distributions. We theoretically and empirically examine asymptotic and robustness properties of the minimum DPD estimators and associated Wald-type test statistics. Moreover, we develop robust estimators and confidence intervals for some important lifetime characteristics. The effect of temperature in solar lights, medium power silicon bipolar transistors and LED lights using real data arising from an step-stress ALT is analyzed applying the robust methods proposed.en
dc.description.provenanceMade available in DSpace on 2025-11-06T16:00:54Z (GMT). No. of bitstreams: 1 Robust inference for IM SST under Weibull lif_MARIA JAENADA MALAGO.pdf: 545464 bytes, checksum: 761ef8c96566cacc853237eb43f082dc (MD5) Previous issue date: 2025-11-03en
dc.description.sponsorshipPID2021-124933NB-I00 - Nuevos Métodos Robustos para Tests con Dispositivos de un Solo Uso No Destructibles bajo el Modelo de Esfuerzos Progresivos. - Ministerio de Universidades
dc.description.versionversión final
dc.identifier.citationN. Balakrishnan, M. Jaenada , and L. Pardo, “ Robust Inference for Intermittently-Monitored Step-Stress Tests Under Weibull Lifetime Distributions.” Quality and Reliability Engineering International (2025): https://doi.org/10.1002/qre.70113
dc.identifier.doihttps://doi.org/10.1002/qre.70113
dc.identifier.issn1099-1638
dc.identifier.urihttps://hdl.handle.net/20.500.14468/30804
dc.journal.titleQuality and Reliability Engineering International
dc.language.isoen
dc.publisherWiley
dc.relation.centerFacultad de Ciencias
dc.relation.departmentEstadística, Investigación Operativa y Cálculo Numérico
dc.relation.projectidinfo:eu-repo/grantAgreement/MICINN//PID2021-124933NB-I00/RobustInference/ROBTEST
dc.rightsinfo:eu-repo/semantics/embargoedAccess
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.es
dc.subject1209.08 Fundamentos de la inferencia estadística
dc.subject1207 Investigación operativa
dc.titleRobust inference for intermittently-monitored step-stress tests under Weibull lifetime distributionsen
dc.typeartículoes
dc.typejournal articleen
dspace.entity.typePublication
relation.isAuthorOfPublication0dae66b3-1736-4f17-8275-ed3e18524f90
relation.isAuthorOfPublication.latestForDiscovery0dae66b3-1736-4f17-8275-ed3e18524f90
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