Publicación: Error dependent sampling to reduce transient events in event-based control
dc.contributor.author | Miguel Escrig, Oscar | |
dc.contributor.author | Romero Pérez, Julio Ariel | |
dc.contributor.author | Sánchez Moreno, José | |
dc.contributor.author | Dormido Bencomo, Sebastián | |
dc.coverage.spatial | Beijing, China | |
dc.coverage.temporal | 2024-12-28 | |
dc.date.accessioned | 2025-05-22T06:30:03Z | |
dc.date.available | 2025-05-22T06:30:03Z | |
dc.date.issued | 2025-03-25 | |
dc.description | Esta es la versión aceptada del artículo. La versión registrada fue publicado por primera vez en IEEE Industrial Electronics Society (IEEE-IES ONCON-2024), está disponible en línea en el sitio web del editor: https://doi.org/10.1109/ONCON62778.2024.10931737. This is the accepted version of the article. The registered version was published for the first time in IEEE Industrial Electronics Society (IEEE-IES ONCON-2024), and is available online on the publisher's website: https://doi.org/10.1109/ONCON62778.2024.10931737. | |
dc.description.abstract | One of the objectives of event-based control is the reduction of generated events to perform an appropriate process control. Among the event generation techniques used to this end, those quantifying the error signal can be found more frequently for its simplicity of implementation. However, they entail a drawback in the form of trade-off between event generation and performance. Aiming to reduce the number of events, specifically in the transient response, without degrading the performance, an error dependent sampling scheme is studied in this work. | en |
dc.description.version | versión final | |
dc.identifier.citation | Error dependent sampling to reduce transient events in event-based control”. O. Miguel-Escrig, J. Sánchez-Moreno, J.A. Romero-Pérez, S. Dormido-Bencomo. 3rd Annual Online Conference of the IEEE Industrial Electronics Society (IEEE-IES ONCON-2024), 8-10 December 2024. https://doi.org/10.1109/ONCON62778.2024.10931737 | |
dc.identifier.doi | https://doi.org/10.1109/ONCON62778.2024.10931737 | |
dc.identifier.isbn | 9798331540319 | |
dc.identifier.isbn | 9798331540326 | |
dc.identifier.uri | https://hdl.handle.net/20.500.14468/26837 | |
dc.language.iso | en | |
dc.publisher | Institute of Electrical and Electronics Engineers | |
dc.relation.center | E.T.S. de Ingeniería Informática | |
dc.relation.congress | 2024 IEEE 3rd Industrial Electronics Society Annual On-Line Conference (ONCON) | |
dc.relation.department | Informática y Automática | |
dc.rights | info:eu-repo/semantics/openAccess | |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-nd/4.0/deed.es | |
dc.subject | 1203.17 Informática | |
dc.subject.keywords | Event-based control | en |
dc.subject.keywords | Symmetric-Send-On- Delta | en |
dc.title | Error dependent sampling to reduce transient events in event-based control | en |
dc.type | actas de congreso | es |
dc.type | conference proceedings | en |
dspace.entity.type | Publication | |
person.familyName | Sánchez Moreno | |
person.givenName | José | |
person.identifier.orcid | 0000-0002-6702-3771 | |
relation.isAuthorOfPublication | cafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1 | |
relation.isAuthorOfPublication.latestForDiscovery | cafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1 |
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