Characterization of limit cycle oscillations induced by Fixed Threshold Samplers

Miguel Escrig, Oscar; Romero Pérez, Julio Ariel; Sánchez Moreno, José; Dormido Bencomo, Sebastián

Publicación:
Characterization of limit cycle oscillations induced by Fixed Threshold Samplers

dc.contributor.author	Miguel Escrig, Oscar
dc.contributor.author	Romero Pérez, Julio Ariel
dc.contributor.author	Sánchez Moreno, José
dc.contributor.author	Dormido Bencomo, Sebastián
dc.contributor.orcid	https://orcid.org/0000-0002-2472-2038
dc.contributor.orcid	https://orcid.org/0000-0002-2405-8771
dc.date.accessioned	2024-05-29T09:18:03Z
dc.date.available	2024-05-29T09:18:03Z
dc.date.issued	2022-06-17
dc.description.abstract	In this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of parameters, which, when selected properly, allow obtaining some of the most used forms of quantization in Event-Based Control (EBC). Because of some sampler characteristics, the obtained limit cycle oscillations can present a bias, therefore, to characterize them the Dual Input Describing Function (DIDF) method is used. The obtained DIDF is analyzed revealing some interesting properties allowing to simplify the robustness analysis. The analysis takes into account the effect of the disturbance and reference signal influence on the system, generally overlooked in DF analysis. Guidelines about how to perform the robustness analysis are given, showing their application through some study cases.	en
dc.description.version	versión final
dc.identifier.citation	O. Miguel-Escrig, J. -A. Romero-Pérez, J. Sánchez-Moreno and S. Dormido, "Characterization of Limit Cycle Oscillations Induced by Fixed Threshold Samplers," in IEEE Access, vol. 10, pp. 62581-62596, 2022, doi: http://doi.org/10.1109/ACCESS.2022.3182794
dc.identifier.doi	http://doi.org/10.1109/ACCESS.2022.3182794
dc.identifier.issn	2169-3536
dc.identifier.uri	https://hdl.handle.net/20.500.14468/22207
dc.journal.title	IEEE Access
dc.journal.volume	10
dc.language.iso	en
dc.publisher	Institute of Electrical and Electronics Engineers
dc.relation.center	Facultades y escuelas::E.T.S. de Ingeniería Informática
dc.relation.department	Informática y Automática
dc.rights	Atribución 4.0 Internacional
dc.rights.uri	https://creativecommons.org/licenses/by-nc-nd/4.0/deed.es
dc.subject	12 Matemáticas::1203 Ciencia de los ordenadores ::1203.17 Informática
dc.subject.keywords	DIDF	en
dc.subject.keywords	limit cycle	en
dc.subject.keywords	robustness	en
dc.subject.keywords	sampling	en
dc.title	Characterization of limit cycle oscillations induced by Fixed Threshold Samplers	en
dc.type	artículo	es
dc.type	journal article	en
dspace.entity.type	Publication
person.familyName	Sánchez Moreno
person.givenName	José
person.identifier.orcid	0000-0002-6702-3771
relation.isAuthorOfPublication	cafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1
relation.isAuthorOfPublication.latestForDiscovery	cafb43c8-2038-4e5c-a3b3-f53b9fc7f8c1