Publicación:
Circuit Testing Based on Fuzzy Sampling with BDD Bases

dc.contributor.authorPinilla, Elena
dc.contributor.authorFernández Amoros, David José
dc.contributor.authorHeradio Gil, Rubén
dc.coverage.temporal2023
dc.date.accessioned2024-10-11T11:03:36Z
dc.date.available2024-10-11T11:03:36Z
dc.date.issued2023
dc.description.abstractFuzzy testing of integrated circuits is an established technique. Current approaches generate an approximately uniform random sample from a translation of the circuit to Boolean logic. These approaches have serious scalability issues, which become more pressing with the ever-increasing size of circuits. We propose using a base of binary decision diagrams to sample the translations as a soft computing approach. Uniformity is guaranteed by design and scalability is greatly improved. We test our approach against five other state-of-the-art tools and find our tool to outperform all of them, both in terms of performance and scalability.en
dc.description.versionversión final
dc.identifier.citationElena Pinilla, David Fernandez-Amoros, Ruben Heradio. Circuit Testing Based on Fuzzy Sampling with BDD Bases. Hawaii International Conference on System Sciences 2023, DOI: 10.24251/HICSS.2023.194
dc.identifier.doihttps://10.24251/HICSS.2023.194
dc.identifier.isbn978-0-9981331-6-4
dc.identifier.urihttps://hdl.handle.net/20.500.14468/24022
dc.language.isoen
dc.publisherUniversity of Hawaiʻi at Mānoa
dc.relation.centerE.T.S. de Ingeniería Informática
dc.relation.congressProceedings of the 56th Hawaii International Conference on System Sciences
dc.relation.departmentIngeniería de Software y Sistemas Informáticos
dc.rightsinfo:eu-repo/semantics/openAccess
dc.rights.urihttp://creativecommons.org/licenses/by-nc-nd/4.0/deed.es
dc.subject33 Ciencias Tecnológicas::3304 Tecnología de los ordenadores
dc.subject.keywordsSAT-samplingen
dc.subject.keywordsFuzzy Samplingen
dc.subject.keywordsIntegrated Circuitsen
dc.subject.keywordsRandom Samplingen
dc.subject.keywordsBinary Decision Diagramsen
dc.titleCircuit Testing Based on Fuzzy Sampling with BDD Baseses
dc.typeartículoes
dc.typejournal articleen
dspace.entity.typePublication
person.familyNameFernández Amoros
person.familyNameHeradio Gil
person.givenNameDavid José
person.givenNameRubén
person.identifier.orcid0000-0003-3758-0195
person.identifier.orcid0000-0002-7131-0482
relation.isAuthorOfPublication60bb7374-7021-4fda-b2cb-ef7f923c64f4
relation.isAuthorOfPublication38af03ae-439e-45a8-8383-80340d20f7cb
relation.isAuthorOfPublication.latestForDiscovery60bb7374-7021-4fda-b2cb-ef7f923c64f4
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