Persona:
Sánchez Moreno, José

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ORCID
0000-0002-6702-3771
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Sánchez Moreno
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José
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2022 - 20232
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search.filters.applied.f.accessLevel: Atribución 4.0 Internacional × Fecha de inicio: 2000 ×

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Mostrando 1 - 2 de 2
  • Miniatura
    Publicación
    An event-based adaptation of the relay feedback experiment for frequency response identification of stable processes
    (Elsevier, 2023-04-13) Sánchez Moreno, José; Torre Cubillo, Luis de la; Chacón Sombría, Jesús; Dormido Canto, Sebastián; Elsevier; https://orcid.org/0000-0003-0898-3462
    An event-based modification of the classical relay feedback experiment without the inclusion of additional elements (integrator, time delay, . . . ) for identification of the spectrum of stable processes between zero and the phase cross-over frequency is presented. By inserting an event-based sampler in the control loop, the natural behaviour of a classical relay is simulated and the system is forced to work in two modes. The event-based sampler activates the first mode by sending control actions to the process every time the error signal crosses zero; this mode is to discover the approximated value of the cross-over frequency ω180◦ . During the second mode, the event-based sampler sends samples to the process simulating that the error signal crosses zero at ω180◦ /N where N is the number of points to identify in the range 0 ≤ ω ≤ ω180◦ . One advantage of this procedure is that the logic used in an already existing relay feedback experiment to fit a transfer function model or tune a controller could be maintained just replacing the relay block by the event-based sampler block presented in the paper. Simulations and experiments with different processes and in presence of noise demonstrate the effectivity of the procedure.
  • Miniatura
    Publicación
    Characterization of limit cycle oscillations induced by Fixed Threshold Samplers
    (Institute of Electrical and Electronics Engineers, 2022-06-17) Miguel Escrig, Oscar; Romero Pérez, Julio Ariel; Sánchez Moreno, José; Dormido Bencomo, Sebastián; https://orcid.org/0000-0002-2472-2038; https://orcid.org/0000-0002-2405-8771
    In this work, a generalized study of the conditions for the appearance of limit cycle oscillations induced by any kind of sampler with multilevel fixed thresholds is presented. These kinds of samplers, which will be referred to as Fixed Threshold Samplers (FTS), are characterized by a series of parameters, which, when selected properly, allow obtaining some of the most used forms of quantization in Event-Based Control (EBC). Because of some sampler characteristics, the obtained limit cycle oscillations can present a bias, therefore, to characterize them the Dual Input Describing Function (DIDF) method is used. The obtained DIDF is analyzed revealing some interesting properties allowing to simplify the robustness analysis. The analysis takes into account the effect of the disturbance and reference signal influence on the system, generally overlooked in DF analysis. Guidelines about how to perform the robustness analysis are given, showing their application through some study cases.